Bruker Dimensional Atomic Force Microscope

Instrument/ServiceType:

Contact and Tapping Mode AFM

Make/ Model:

Bruker/Digital Instruments DI 3100

Instrument Description:

Instrument Description: A scanning probe microscope typically used for surface characterization and height measurements at the angstrom level.

Instrument Website URL:Ìý

Primary Contact:

Scot Bohnenstiehl

Email: kecklab@jila.colorado.eduÌý

Phone: 303.492.2389

Home Department/Institute:

JILA

Home Facility:

JILA Keck Lab

Instrument Location:

JILA S105